Hprobe announces a significant order for MRAM testing equipment from a tier-1 semiconductor manfacturor

Hprobe, a developer of testing equipment for magnetic devices, announced a 'significant' order for a wafer-level magnetic tester (the company's IBEX tester) from a tier-1 semiconductor manufacturer.

The equipment will be used for research and development of magnetic materials and devices, which represents a very promising technology for MRAM chips and magnetic sensors. The IBEX platform is compatible with 200mm and 300mm automated wafer probers, and is dedicated to testing MRAM magnetic tunnel junctions, bit cells based on STT-MRAM, SOT-MRAM, and Voltage Controlled (VC-MRAM) technologies.

In 2020 Hprobe raised more than 2 million euros from a group of international investors. The new funds will support Hprobe's spintronics device testing development - which include MRAM and TMR sensors.

Posted: Apr 28,2021 by Ron Mertens