Hprobe was established in March 2017 as a spin-off from SPINTEC, with an aim to develop and produce wafer-level testing equipment for magnetic devices. The company developed a unique patented technology of multidimensional magnetic field generator for STT-MRAM and TMR sensors wafer level characterization and testing.
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Mycronic acquires MRAM test equipment developer Hprobe
Hprobe, a developer of testing equipment for magnetic devices, has been acquired by Mycronic, a Swedish high-tech company specializing in precision production equipment for the electronics industry.

Hprobe says that the integration represents a strategic move to enhance Hprobe’s technological and market leadership in MRAM and magnetic sensor testing, supporting the transition to high-volume manufacturing, and enhancing reliability and performance for end-users. by leveraging Mycronic’s global infrastructure, Hprobe will expand its presence across Asia, North America, and Europe while accelerating its technology and product roadmaps to meet growing demand for wafer testing of advanced MRAM and next-generation TMR sensors.
Hprobe and NY CREATES to co-develop next-generation MRAM testing capabilities
Hprobe, a developer of testing equipment for magnetic devices, announced a strategic collaboration with NY CREATES, a lab-to-fab bridge for advanced electronics, to advance testing capabilities for next-generation semiconductor memory technologies. This joint development project will focus on the co-development of advanced testing equipment at the 300mm wafer scale.

NY CREATES and Hprobe will work together to support new testing solutions for MRAM, RRAM and selector devices. The joint project will focus on initial testing of MRAM and RRAM wafers from NY CREATES using Hprobe’s equipment, including the full-scale implementation of Hprobe’s IBEX wafer-level magnetic tester. Development of breakthrough testing procedures and algorithms for MRAM, RRAM, and selector devices, will also seek to advance the state-of-the-art in semiconductor memory testing.
Hprobe releases a new MRAM testing module to help increase production yields
Hprobe, a developer of testing equipment for magnetic devices, announced a new addition to its product line, the RF Pulse Module. The company says that this is the commercially available testing system to both collect statistics of error rate of the memory unit cell and take a deep look into switching dynamics of resistive memories.

Hprobe's IBEX system
Hprobe says that the RF Pulse Module is two orders of magnitude faster than existing devices and can help increase manufacturing yields. Hprobe has already begun shipping to tier-1 companies and major research institutes around the world.
Hprobe announces a large magnetic tester order from a Korean semiconductor maker
Hprobe, a developer of testing equipment for magnetic devices, announced a significant order from a tier-1 semiconductor manufacturer in Korea for a wafer-level magnetic tester.

Hprobe's IBEX platform is compatible with 200mm and 300mm automated wafer probers, and is dedicated to testing MRAM magnetic tunnel junctions, bit cells based on STT-MRAM, SOT-MRAM, and Voltage Controlled (VC-MRAM) technologies.
Hprobe launches a next-generation MRAM wafer sort magnetic test head
Hprobe announced a new magnetic test head for MRAM Wafer Sort. The new module, the H3DM-XL, is at the heart of the latest addition to Hprobeâs IBEX line, the IBEX-WS.

The IBEX-WS test equipment integrates 3D magnetic field capabilities, while increasing field area and uniformity for wafer probing large MRAM arrays. It also features a unique patented robotized 3D Field Calibration Unit (FCU) for high-speed field mapping and monitoring.
Hprobe announces a significant order for MRAM testing equipment from a tier-1 semiconductor manfacturor
Hprobe, a developer of testing equipment for magnetic devices, announced a 'significant' order for a wafer-level magnetic tester (the company's IBEX tester) from a tier-1 semiconductor manufacturer.

The equipment will be used for research and development of magnetic materials and devices, which represents a very promising technology for MRAM chips and magnetic sensors. The IBEX platform is compatible with 200mm and 300mm automated wafer probers, and is dedicated to testing MRAM magnetic tunnel junctions, bit cells based on STT-MRAM, SOT-MRAM, and Voltage Controlled (VC-MRAM) technologies.
Hprobe raises over 2 million Euros to support its MRAM device testing equipment development
Hprobe, a developer of testing equipment for magnetic devices, has raised more than 2 million euros from a group of international investors. The new funds will support Hprobe's spintronics device testing development - which include MRAM and TMR sensors.

The investment round was led by Germany-based High-Tech Gründerfonds (HTGF), a public-private venture capital investment firm. Other investors include Taiwan ITRI's ITIC VC firm and TEL Venture Capital.
Hprobe says first MRAM tester qualified by a major foundry in Taiwan for production use
Hprobe, a developer of testing equipment for magnetic devices, says its first Hprobe MRAM tester was qualified for use by a major Taiwan-based foundry for production use. Hprobe says that this is an important milestone and the company believes it is just the beginning of the global MRAM production ramp up.

Hprobe recently announced that it developed a new technology for ultra-fast (
Hprobe developed an ultra-fast technology for STT-MRAM device testing
Hprobe, a developer of testing equipment for magnetic devices, announced that it developed a new technology for ultra-fast (

Hprobe will integrate the new technology into its Hprobe ATE systems to drastically enhance the sorting flow of STT-MRAM wafers at major 300mm foundries.
Hprobe teams up with IMEC to develop SOT-MRAM testing tools
Hprobe, a developer of testing equipment for magnetic devices, announced that it has teamed up with the IMEC research institute to jointly extend Hprobe's fast testing protocols for SOT-MRAM devices.

Hprobe has already begun to optimize its test flow for SOT-MRAM devices in order to bring the characterization and testing to an industrial level with the primary objective to reduce the testing time while maximizing yield.