Capres A/S is a Danish company established in 1999 to develop and market a unique probe technology designed for in-line production monitoring in the semiconductor industry.
Capres, in collaboration with IBM developed a resistivity measurement technique to characterize MTJ stacks used in HDD read heads and MRAM devices.
The Capres CIPTech tool (Current In Plane Tunneling Technique) enables a very fast non-destructive characterization of Magnetic Tunnel Junctions, STT-MRAM, MRAM and HDD read heads. The tool allows for auto extraction of MR/RA without sample patterning.
DK - 2800 Kongens Lyngby