June 2012

MicroSense says that they see an increase in orders for its MRAM magnetic metrology systems. MicroSense's metrology tools characterize the magnetic properties of multi-layer wafers used in the development and manufacturing of perpendicular MRAM. They offer a 300mm Polar Kerr (out-of-plane) MRAM metrology system, the KerrMapper (in-plane) tool and Vibrating Sample Magnetometers (VSM) for MRAM makers.

The company has been selling Gen-1 MRAM metrology tools since 2004. They say that now, with the recent developments in STT-MRAM, they see a number of new MRAM tool orders.

Tohoku University and Belgium's imec announced a a new collaboration in which the new twill work closely on several areas of research. Tohoku and imec already collaborate on advanced interconnects, MEMS and low-power sensor circuit readout designs, and in the future they will also jointly research MRAM, 3D integration technology, biosensors and wireless communication.