MicroSense sees increased orders for its new MRAM metrology system

MicroSense says that they see an increase in orders for its MRAM magnetic metrology systems. MicroSense's metrology tools characterize the magnetic properties of multi-layer wafers used in the development and manufacturing of perpendicular MRAM. They offer a 300mm Polar Kerr (out-of-plane) MRAM metrology system, the KerrMapper (in-plane) tool and Vibrating Sample Magnetometers (VSM) for MRAM makers.

The company has been selling Gen-1 MRAM metrology tools since 2004. They say that now, with the recent developments in STT-MRAM, they see a number of new MRAM tool orders.

Posted: Jun 21,2012 by Ron Mertens