Capres A/S was established in 1999 in Denmark to develop a unique probe technology designed for in-line production monitoring in the semiconductor industry. The company, in collaboration with IBM, developed a resistivity measurement technique to characterize MTJ stacks.
Bo Svarrer Hansen, the company's CEO since 2002, was kind enough to answers a few questions we had, and share with us his views on the MRAM market and the company's measurement systems for MRAM and STT-MRAM device developers.
Q: Can you update us on Capres' current offers to the MRAM industry?
Capres customers are using our CIPTech® tools for R&D on small samples as well as volume production on 300 mm wafers. Depending on the configuration the tools measure with an in- plane or an out- of- plane magnetic field on blanket as well as patterned wafers.