ISI released the world's first fully integrated STT-MRAM wafer-level analyzer

Integral Solutions International (ISI) released today a new wafer-level analyzer for STT-MRAM characterization, the WLA-3000. They say that this is the world's first commercially available and fully integrated solution to address the needs of production level testing of STT-MRAM wafers.

The WLA-3000 includes proprietary magnets, pulse generator module, probecard interfaces, and measurement electronics that were all specifically developed by ISI. ISI says they already shipped several of these testers which have now been qualified for high volume production testing of STT-MRAM devices.

Here's the full portfolio of STT-MRAM tests supported by the WLA-3000:

  • I-V and R-V Curves
  • Breakdown Voltage
  • Transfer Curve with variable sweep rate
  • Switching Currents vs. Pulse Widths
  • Endurance Testing
  • Switching Probability vs. Applied Voltage
  • Low/High State R-V Distribution
  • Read Disturb
  • Error Rate Testing
  • Field Write Probability
  • Voltage Back Hopping
  • Sweeping Field Angle
Posted: May 24,2012 by Ron Mertens