International Conference on Microelectronic Test Structures (ICMTS) 2007

Submitted by Ron Mertens on Mon, 01/01/2007 - 10:40
Event Duration:  
Event duration
Takeda Hall, the University of Tokyo, Tokyo, Japan

The conference will presnet original papers about new developments in silicon, III-V compounds, and nanotechnology microelectronics test structure research, implementation, and applications as well as test structures aimed at new materials and devices characterization are solicited.

One of the topics - evaluation of MRAM, RRAM, FeRAM, SRAM, NVM, and SOI-Based Memory cells, evaluation and optimization of standard cell macros and other product circuits. Low Noise Amplifier and other RF product testing.