Integral Solutions Int’l (ISI)

Integral Solutions International (ISI) announced a new 3-Axis Magnet Option for wafer-level testing. Combined with ISI's WLA5000 Tester, the 3D magnetic fields produced by this system can be used for characterization of MRAM devices in addition to 2D/3D Magnetic Sensors.

ISI says that for MRAM applications, the 3D Magnetic fields produced by ISI’s 3-Axis Magnet Option delivers solutions for both STT-MRAM and SOT-MRAM applications.

Integral Solutions International (ISI) announced its first shipment of a commercial SOT-MRAM tester system. This new equipment was developed by integrating a commercial pulser with ISI's proprietary bias-tee and measurement electronics.

ISI says that the new tester system generates pulses as narrow as 300pS, suitable for R&D applications which require extremely narrow pulse widths. In parallel, ISI is also developing its proprietary Gen-4 Pulser System, which will provide high-throughput and cost-effective measurement solutions with the flexibility of testing either STT-MRAM or SOT-MRAM devices. The Gen-4 system is expected to be released in the fall of 2021.

Integral Solutions International released a 5,000 Oe perpendicular magnet for WLA-3000, their wafer-level STT-MRAM analyzer. ISI says that this new magnet is optimally matched with its proprietary probe card interface to produce up to 5,000 Oe for the latest generation of STT-MRAM devices.

The new magnet increases maximum field while also improving z-field uniformity to +/- 0.25mm, while maintaining near zero remanence fields. It can also operate with 66% higher magnetic field duty cycle compared to the previous 3,000 Oe Perpendicular Magnet system.

Integral Solutions International (ISI) announced a new module the WLA-3000 STT-MRAM Wafer Level Analyzer, the Gen3 Pulser. The new module is optimally matched with its proprietary probecard interface to produce programmable pulses as low as 5nS, with in-situ ability to perform ultra-fast measurements on the MTJs after pulsing.

The tester can be equipped with either the single or dual-channel pulse generator modules for improved UPH. The Gen3 Pulser module was redesigned to speed up Pulse related tests by an order of magnitude and features new Error Rate test (it can measure Error Rate of 10^6 in approximately 2 seconds). It is noew possible to characterize error rate as a function of VBias, Pulse Width/Amplitude, Field and other sweep parameters.

Integral Solutions International (ISI) released today a new wafer-level analyzer for STT-MRAM characterization, the WLA-3000. They say that this is the world's first commercially available and fully integrated solution to address the needs of production level testing of STT-MRAM wafers.

The WLA-3000 includes proprietary magnets, pulse generator module, probecard interfaces, and measurement electronics that were all specifically developed by ISI. ISI says they already shipped several of these testers which have now been qualified for high volume production testing of STT-MRAM devices.

Avalanche Technology and Integral Solutions International (ISI) have designed a Wafer Level Analyzer, the WLA-3000, to be used in STT-MRAM development.

The WLA-3000 includes specific hardware test modules including nS-range Pulse Generator that quickly measures switching currentse of MTJ devices in STT-MRAM as a function of Pulse Width. Using this Pulse Generator module, customers will be able to perform Error Rate, Switching Probability, Endurance Testing, and Read/Write Disturb analysis in a fraction of time as compared to other slower pulsers.

The WLA-3000 system is fully compatible with ISI’s FMRA-2008 Ferromagnetic Resonance Analyzer to offer the worlds most advanced and complete MTJ sensor analysis.