MicroSense announced that they installed a full suite of STT-MRAM magnetic metrology tools at a leading edge semiconductor manufacturer. These metrology systems characterize the magnetic properties of multi-layer 300 mm wafers or coupons used in the development and manufacturing of Perpendicular and In-Plane STT-MRAM.
The company says that this is the first time a major customer ordered a full suite of their tools to use in an STT-MRAM program. This order includes a Polar Kerr system for 200mm or 300mm Perpendicular STT-MRAM wafers and a KerrMapper tool for 200mm or 300mm In-plane STT-MRAM wafers. MicroSense's EZ Vibrating Sample Magnetometer measures sample coupons from Perpendicular or In-Plane STT-MRAM wafers.
Posted: Jan 15,2014 by Ron Mertens