Keysight Technologies to launch an STT-MRAM test solution product developed in collaboration with Tohoku and the CIES

Keysight Technologies announced it will launch STT-MRAM test solution products, developed in collaboration with Tohoku University and the Center for Innovative Integrated Electronic System (CIES).

Keysight says that they aim to release the test solution in early 2016. This will address "various challenges in industry".

Posted: Mar 17,2015 by Ron Mertens