Integral Solutions International released a 5,000 Oe perpendicular magnet for WLA-3000, their wafer-level STT-MRAM analyzer. ISI says that this new magnet is optimally matched with its proprietary probe card interface to produce up to 5,000 Oe for the latest generation of STT-MRAM devices.
The new magnet increases maximum field while also improving z-field uniformity to +/- 0.25mm, while maintaining near zero remanence fields. It can also operate with 66% higher magnetic field duty cycle compared to the previous 3,000 Oe Perpendicular Magnet system.
Posted: Sep 29,2015 by Ron Mertens